中文簡(jiǎn)介

IEEE設(shè)備和材料可靠性事務(wù)季刊。它提供對(duì)可靠電子設(shè)備和材料的創(chuàng)造至關(guān)重要的前沿信息，并在電子設(shè)備及其制造中使用的材料的可靠性方面成為跨學(xué)科交流的重點(diǎn)。它側(cè)重于電子、光學(xué)、磁器件和微系統(tǒng)的可靠性;用于制造這些裝置的材料和工藝;以及這些材料的界面和表面。

　　英文簡(jiǎn)介

IEEE Transactions on Device and Materials Reliability is published quarterly. It provides leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It focuses on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the manufacture of these devices; and the interfaces and surfaces of these materials.

　　近年期刊影響因子趨勢(shì)圖

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